Cell design for low-temperature time-domain reflectance measurements
- 1 January 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (1) , 99-103
- https://doi.org/10.1063/1.1143721
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Time domain reflection methods for dielectric measurements to 10 GHzJournal of Applied Physics, 1989
- Approach to glassy behavior of dielectric relaxation in 3-bromopentane from 298 to 107 KThe Journal of Chemical Physics, 1986
- Bridge Sampling Methods for Admittance Measurements from 500 kHz to 5 GHzIEEE Transactions on Instrumentation and Measurement, 1983