Imaging of high-power microwave-induced surface flashover
- 1 January 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Plasma Science
- Vol. 27 (1) , 138-139
- https://doi.org/10.1109/27.763092
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Window breakdown caused by high-power microwavesIEEE Transactions on Plasma Science, 1998
- Dielectric materials for use as output window in high-power klystronsIEEE Transactions on Electrical Insulation, 1993
- Breakdown of alumina rf windowsReview of Scientific Instruments, 1989