Time-of-flight spectrometer for the determination of microradian projectile scattering angles in atomic collisions
- 9 November 1987
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 125 (4) , 193-196
- https://doi.org/10.1016/0375-9601(87)90096-x
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Absolute cross sections for projectile-charge-state-correlated multiple-ionisation processes in Ne-Ne collisionsJournal of Physics B: Atomic and Molecular Physics, 1986
- Mechanisms of inner-shell vacancy production in slow ion-atom collisionsPhysics Reports, 1986
- Coincidence measurements of electron capture and target ionization in multiply chargedcollisionsPhysical Review A, 1983
- Correlated capture ionization in slow collisions of multiply charged Xe ions with Xe atomsPhysics Letters A, 1981
- Charge-state correlated cross sections for the production of low-velocity highly charged Ne ions by heavy-ion bombardmentPhysical Review A, 1980
- 7. Coincidence Experiments for Studying Impact-Parameter-Dependent and Charge-Changing ProcessesPublished by Elsevier ,1980
- Production of highly charged low-velocity recoil ions by heavy-ion bombardment of rare-gas targetsPhysical Review A, 1979
- Statistical Model for theAr+-on-Ar CollisionPhysical Review B, 1966