Kleinwinkel-lonendünnung für die Transmissionselektronenmikroskopie (TEM) / Low Angle Ion Milling for Transmission Electron Microscopy (TEM)
- 1 August 1994
- journal article
- research article
- Published by Walter de Gruyter GmbH in Practical Metallography
- Vol. 31 (8) , 422-425
- https://doi.org/10.1515/pm-1994-310806
Abstract
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