Bipolar Schottky logic device failure modes due to contact metallurgical degradation
- 1 January 1982
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 22 (6) , 1155-1175
- https://doi.org/10.1016/s0026-2714(82)80567-2
Abstract
No abstract availableKeywords
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