A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

This publication has 5 references indexed in Scilit:

• Manganese ferrite thin films Part I: Preparation and structure
  Thin Solid Films, 1972
• Indexing polycrystalline and single-crystal patterns
  Published by Springer Nature ,1967
• Über die Bestimmung von Gitterkonstanten mittels Elektroneninterferenzen
  Zeitschrift für Naturforschung A, 1957
• The lattice constants and expansion coefficients of some halides
  Acta Crystallographica, 1953
• LXIII. The precision of measurement of broad spectrum lines, with special reference to electron-diffraction photographs
  Journal of Computers in Education, 1945