Comments on "A new look at yield of integrated circuits"
- 1 July 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 59 (7) , 1128
- https://doi.org/10.1109/proc.1971.8351
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A new look at yield of integrated circuitsProceedings of the IEEE, 1970
- Cost-size optima of monolithic integrated circuitsProceedings of the IEEE, 1964