Characterization of reorientation of a thin layer of ferroelectric liquid-crystal material under an applied field by excitation of optical modes

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Abstract
The director configuration in a thin layer of ferroelectric liquid crystal (FLC) under an applied static field is investigated by exciting optic modes in a FLC cell. The reflectivity data obtained may only be fitted to theory by maintaining in the voltage‐distorted optical tensor profile a point in the middle of the cell having the same structure as at 0 V. This unambiguously confirms the chevron structure observed in x‐ray diffraction and shows that the layering remains largely undistorted to fields of order 3×106 V m−1.