Surface plasmon microscopy
- 24 September 1987
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 23 (20) , 1091-1092
- https://doi.org/10.1049/el:19870762
Abstract
The use of surface plasmon resonance measurements for the imaging of surfaces has been investigated. Images of dielectric patterns deposited on silver films are presented, with thickness sensitivity of about 3 Å and a lateral resolution of about 25μm.Keywords
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