A Grazing Incidence X-Ray Reflectometer for Rapid Nondestructive Characterization of Thin Films and Interfaces
- 1 January 1991
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-Ray Reflectivity Study of Single- and Bicrystals of GoldMRS Proceedings, 1990
- Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivityJournal of Applied Physics, 1988
- X-ray Microtomography with Synchrotron RadiationPublished by SPIE-Intl Soc Optical Eng ,1986
- CXVII. The total reflexion of X-raysJournal of Computers in Education, 1923