Novel AlInAs/InP HEMT

Abstract
The fabrication of the first AlInAs/InP HEMT is reported. This device has extrinsic transconductance of 40mS/mm, gate-drain and drain-source breakdown voltages of 20 V and saturation drain current densities of 0.1 A/mm of gate width. These preliminary results show the potential of the AIInAs/InP heterojunctions for a wide variety of application including microwave power HEMTs.

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