Tie set approach to determine the frequency of system failure
- 1 June 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (3) , 293-294
- https://doi.org/10.1016/0026-2714(75)90705-2
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A new method to determine the failure frequency of a complex systemMicroelectronics Reliability, 1973