Hot-electron microcalorimeters as high-resolution x-ray detectors
- 5 June 1995
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 66 (23) , 3203-3205
- https://doi.org/10.1063/1.113723
Abstract
Measurements are presented on a novel microcalorimeter for the detection of x rays. This detector uses a normal metal film deposited on a thin membrane to absorb x-ray photons. The subsequent temperature rise of the electrons is measured from the current–voltage characteristics of a normal-insulator-superconductor tunnel junction, where part of the absorber forms the normal electrode. A superconducting-quantum-interference-device is used as a low-noise high-bandwidth readout for the junction. We have measured an energy resolution of 22 eV full width at half-maximum and a time constant of 15 μs for a detector operating at 80 mK and having a 0.5 μm thick Au absorber with an area of 100×100 μm2.Keywords
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