Precision in the ellipsometric determination of the optical constants of very thin films
- 15 August 1982
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 21 (16) , 2968-2971
- https://doi.org/10.1364/ao.21.002968
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- Ellipsometry of transparent films on transparent substratesSurface Science, 1980
- Optical properties of very thin filmsThin Solid Films, 1976