Development of a system to analyse the structure of a submicrometre-sized single crystal by synchrotron X-ray diffraction
- 1 August 1991
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 24 (4) , 340-348
- https://doi.org/10.1107/s0021889891002133