Abstract
The spacings and strengths of plasmon resonances in the optical properties of thin films depend on film symmetry, i.e., on whether the film surfaces are identical or not. Taking account of film asymmetry, the reinterpretation of photoyield data of Anderegg, Feuerbacher, and Fitton explains the fairly systematic alternation of their plasmon-associated resonance strengths and implies that their best-fit values of film thicknesses were about twice too large.