Exponential temperature dependence of the critical transport current in Y-Ba-Cu-O thin films
- 5 June 1989
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (23) , 2370-2372
- https://doi.org/10.1063/1.101531
Abstract
We have measured the critical currents in rf-sputtered YBa2Cu3O7−x thin films deposited on polycrystalline yttria-stabilized zirconia substrates as a function of temperature down to 10 K. The dependence of the granular films at low temperature indicated exponential behavior which is similar to the superconductor-normal metal-superconductor (S-N-S) type tunneling junctions. For the films with a grain size of approximately 1 μm, we observed two exponential decay constants, which suggest that Josephson junctions limiting the transport critical current are possible both at the grain boundaries and at twin boundaries.Keywords
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