Photoacoustic determination of field enhancement at a silver surface arising from resonant surface plasmon excitation

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Abstract
The field enhancement due to resonant surface plasmon excitation using the attenuated total reflection method is described. For the 500-Å-thick silver film evaporated on the flat side of a hemisphere prism, the absorptance and photoacoustic (PA) signal are measured as functions of incident angle for three different incident photon energies. The angle dependence of the field enhancement is obtained from the power absorptance achieved from the PA signal.