Abstract
Temporal integration functions of tone bursts masked by critical band noises become shallower with increasing test tone frequency. This holds for tone bursts in the centre as well as at the slopes of the masking pattern of critical band maskers. When shortening the tone bursts, the horizontal masking pattern of uniform masking noise changes into a pattern with decreasing slope for increasing frequency. The shape of the masking pattern of critical band maskers remains rather independent of test tone duration.

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