Contrast in high‐resolution scanning electron microscope images
- 1 February 1991
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 161 (2) , 343-355
- https://doi.org/10.1111/j.1365-2818.1991.tb03095.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- An empirical stopping power relationship for low‐energy electronsScanning, 1989
- Secondary electron emission in the scanning electron microscopeJournal of Applied Physics, 1983
- Scanning Electron Microscopy and X-Ray MicroanalysisPublished by Springer Nature ,1981
- Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitationsPhilosophical Magazine A, 1978