Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?
- 15 March 1997
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 81 (6) , 2499-2503
- https://doi.org/10.1063/1.363957
Abstract
We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of λ/2 and diffraction limited.This publication has 14 references indexed in Scilit:
- Near field microscopy and lithography with uncoated fiber tips: a comparisonOptics Communications, 1995
- Near field microscopy and near field opticsReports on Progress in Physics, 1994
- Apertureless near-field optical microscopeApplied Physics Letters, 1994
- Reflection-scanning near-field optical microscopy and spectroscopy of opaque samplesApplied Physics A, 1994
- External-reflection near-field optical microscope with cross-polarized detectionApplied Optics, 1994
- External and internal reflection near field microscopy: experiments and resultsApplied Optics, 1990
- Model for reflection near field optical microscopyApplied Optics, 1990
- Optical interaction between a dielectric tip and a nanometric lattice: implications for near-field microscopyJournal of the Optical Society of America B, 1990
- Optical stethoscopy: Image recording with resolution λ/20Applied Physics Letters, 1984
- Development of a 500 Å spatial resolution light microscopeUltramicroscopy, 1984