Measurement of spatial variation of responsiveness in solid-state imager
- 1 December 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-35 (4) , 646-648
- https://doi.org/10.1109/tim.1986.6831787
Abstract
An experimental setup that provides the measurement of the spatial variation of the responsiveness of a single photodiode belonging to a linear metal-oxide-semiconductor (MOS) photoarray is described. An optical microscanning technique has been employed to sequentially illuminate a small area of a single photoelement in order to achieve the mapping of its spatial responsiveness. Experimental results for a single pixel are graphically presented.Keywords
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