Strain and strain relaxation in semiconductors

• 1 January 1997
• journal article
• Published by Springer Nature in Journal of Materials Science: Materials in Electronics
• Vol. 8  (6) , 337-375
• https://doi.org/10.1023/a:1018547625106

Abstract

Keywords

• GAAS
• BURGER VECTOR
• CRITICAL THICKNESS
• PEAK SPLITTING
• COHERENCY STRAIN