Dynamic Scaling, Island Size Distribution, and Morphology in the Aggregation Regime of Submonolayer Pentacene Films

Scaling behavior of the island size distribution through a universal scaling function $f(u)$ is demonstrated for submonolayer pentacene islands in the aggregation regime ($0.1<\theta <0.5$) grown on oxidized silicon surfaces. The distribution of $f(u)$ suggests that four molecules constitute the smallest stable island. The structure factor $S(\mathbf{k})$ of the submonolayer films calculated from AFM micrographs compares well with diffuse x-ray intensities from in situ experiments. The structure factor was decomposed into the contribution from the average island shape and the interisland distribution confirming that a unique characteristic length scale regulates the growth dynamics.