High-Temperature Stress Measurements During the Oxidation of NiAl

• 1 January 2000
• journal article
• Published by Springer Nature in Oxidation of Metals
• Vol. 53  (3/4) , 259-272
• https://doi.org/10.1023/a:1004585003083

Abstract

Keywords

• X RAY DIFFRACTION
• INTERMETALLIC COMPOUND
• ROOM TEMPERATURE
• RESIDUAL STRESS