CORE STRUCTURE OF CSL BOUNDARIES IN NiO

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Abstract
Atomic resolution electron microscopy is used to study CSL tilt boundaries in NiO. Asymmetric as well as symmetric grain-boundary plane orientations are found in bicrystals grown by the Verneuil technique. The Σ = 5, (310) grain boundary is observed to occur in two distinct forms, both of which differ from previously proposed theoretical models. The Σ = 13, (510) boundary, in addition to also showing a multiplicity of structures, is not planar on an atomic scale, but includes displacements of structural units normal to the average grain-boundary plane. It is suggested that the reduced atomic density at high-purity ceramic-oxide grain boundaries is not only due to lattice expansion, but is in part due to a high concentration of Schottky pairs in the grain boundary

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