Observation of different reflected high-energy electron diffraction patterns during atomic layer epitaxy growth of CdTe epilayers
- 1 December 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 115 (1-4) , 692-697
- https://doi.org/10.1016/0022-0248(91)90829-t
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Atomic-layer epitaxy of (100) CdTe on GaAs substratesJournal of Crystal Growth, 1990
- Surface Processes in ALE and MBE Growth of ZnSe: Correlation of RHEED Intensity Variation with Surface CoverageJapanese Journal of Applied Physics, 1989
- Dynamic effects in RHEED from MBE grown GaAs(001) surfacesSurface Science, 1986