Photoelastic Measurements Of Residual Stresses For NDE
- 17 February 1987
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 814, 16-19
- https://doi.org/10.1117/12.941652
Abstract
Photoelastic measurements of residual strains are used extensively in the QC and inspection of transparent materials. A new method of measurements, based on Spectral Contents Analysis, is described in this paper. The method uses a personal computer for photoelastic data acquisition, eliminating personal skill and subjectivity. The new tool should make the measurements of residual strains for QC simpler and more reliable.© (1987) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.Keywords
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