Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2349-2355
- https://doi.org/10.1109/23.45447
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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