The characterization of silicon nitride films by contactless transient photoconductivity measurements
- 1 February 2001
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 383 (1-2) , 61-64
- https://doi.org/10.1016/s0040-6090(00)01784-3
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Theoretical and experimental study of charge carrier kinetics in crystalline siliconJournal of Applied Physics, 1999
- Investigation of charge carrier injection in silicon nitride/silicon junctionsApplied Physics Letters, 1996
- Charge-carrier kinetics in semiconductors by microwave conductivity measurementsJournal of Applied Physics, 1995