Measurement of grain-boundary segregation by STEM-EDX analysis

Publisher Website

1 April 1989

journal article
Published by Elsevier in Ultramicroscopy

Vol. 28 (1-4) , 236-239
https://doi.org/10.1016/0304-3991(89)90301-x

Abstract

No abstract available

Keywords

GRAIN BOUNDARY

This publication has 1 reference indexed in Scilit:

Experimental determination of the probe profile in a dedicated scanning transmission electron microscope
Ultramicroscopy, 1987