The Electrical Characteristics of Silicon P-N-P-N Triodes
- 1 June 1958
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 46 (6) , 1229-1235
- https://doi.org/10.1109/jrproc.1958.286908
Abstract
An investigation is made of the electrical characteristics of three-terminal silicon p-n-p-n structures, where electrical contact is made to both outer (emitter) regions and to one of the inner (base) regions. When the base current Ib is zero, the V-I characteristic naturally is identical to the two-terminal case, i.e., ranges of high and low impedance separated by a region of differential negative resistance. Base current supplied from an independent, external circuit is found to decrease the breakover (peak) voltage and to decrease the turn-off current, i.e., the current at which the device enters the low impedance state. In fact, the p-n-p-n triode is found to exhibit switching properties closely analogous to the conventional thyratron. As an extension of earlier work, a general analysis of four-region structures is presented and is applied specifically to the p-n-p-n triode. Much of the detailed behavior of the device can be explained in terms of this analysis, and theoretical curves are given which are in good agreement with the experimental results.Keywords
This publication has 11 references indexed in Scilit:
- Three-terminal P-N-P-N transistor switchesIRE Transactions on Electron Devices, 1958
- Germanium power switching devicesIRE Transactions on Electron Devices, 1958
- The "Thyristor"—A new high-speed switching transistorIRE Transactions on Electron Devices, 1958
- Carrier Generation and Recombination in P-N Junctions and P-N Junction CharacteristicsProceedings of the IRE, 1957
- P-N-P-N Transistor SwitchesProceedings of the IRE, 1956
- Alloyed Junction Avalanche TransistorsBell System Technical Journal, 1955
- Avalanche Breakdown in SiliconPhysical Review B, 1954
- Four-Terminal P-N-P-N TransistorsProceedings of the IRE, 1952
- Statistics of the Recombinations of Holes and ElectronsPhysical Review B, 1952
- Junction TransistorsPhysical Review B, 1951