X-Ray-Diffraction Topographic Studies of Magnetic-Domain Configurations in Terbium Iron Garnet
- 1 July 1967
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (8) , 3190-3192
- https://doi.org/10.1063/1.1710087
Abstract
The method of x-ray-diffraction topography, which is briefly described is applied to the study of magnetic domains in a single-crystal sample of Tb3Fe5O12. Comparison is made with the same domain structure observed by transmitted polarized light and Bitter patterns, and a general interpretation of the diffraction topograph is suggested. Finally, the possible applications of the technique, particularly with respect to garnet materials, are briefly discussed.This publication has 4 references indexed in Scilit:
- X-ray topographic studies of dislocations in iron-silicon alloy single crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1965
- X-RAY TOPOGRAPHIC STUDIES OF MAGNETIC DOMAIN CONFIGURATIONS AND MOVEMENTSApplied Physics Letters, 1962
- The projection topograph: a new method in X-ray diffraction microradiographyActa Crystallographica, 1959
- The growth of single crystals of magnetic garnetsJournal of Physics and Chemistry of Solids, 1958