Development of a Laboratory EXAFS Facility
- 1 May 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (5R)
- https://doi.org/10.1143/jjap.22.882
Abstract
An EXAFS (extended X-ray absorption fine structure) spectrometer incorporating a rotating anode X-ray source and standard optics with flat crystal is decreibed. By using a solid state detector to prevent harmonics and fast detection electronics to achieve a high count rate, we found that the conventional spectrometer can supply EXAFS spectra accurate enough for practical analysis. The systematic errors involved in EXAFS measurement are discussed in relation to the improvements designed into the present system.Keywords
This publication has 14 references indexed in Scilit:
- A Dispersive Method of Measuring Extended X-Ray Absorption Fine StructureJapanese Journal of Applied Physics, 1981
- Thickness effect on the extended-x-ray-absorption-fine-structure amplitudePhysical Review B, 1981
- Many-body effects on extended x-ray absorption fine structure amplitudesPhysical Review B, 1980
- Extended x-ray absorption fine structure analysis of interatomic distances, coordination numbers, and mean relative displacements in disordered alloysPhysical Review B, 1980
- New method for the calculation of atomic phase shifts: Application to extended x-ray absorption fine structure (EXAFS) in molecules and crystalsPhysical Review B, 1977
- Extraction of crystal parameters from EXAFS spectraSolid State Communications, 1976
- Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected resultsPhysical Review B, 1975
- Extended x-ray-absorption fine-structure technique. III. Determination of physical parametersPhysical Review B, 1975
- New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine StructurePhysical Review Letters, 1971
- A note on the structure of nickel oxide at subnormal and elevated temperaturesActa Crystallographica, 1948