Measurement of individual structure-factor phases with tenth-degree accuracy: the 00.2 reflection in BeO studied by electron and X-ray diffraction
- 1 May 1993
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
- Vol. 49 (3) , 422-429
- https://doi.org/10.1107/s0108767392010699
Abstract
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