Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

1 January 2000

journal article
research article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques

Vol. 48 (2) , 288-294
https://doi.org/10.1109/22.821779

Abstract

A comprehensive electrooptic field-mapping technique is applied to the characterization of near-field radiation patterns above a microstrip patch antenna. The amplitude and phase maps of three orthogonal electric-field components, measured using electrooptic crystals above the patch, also have revealed the transition from the near field to the far field of the radiation pattern, In addition, experimental results have been compared with a finite-element method (FEM) simulation, The measurements show superior results to the FEM simulation, especially in terms of spatial resolution and data acquisition times. Furthermore, the scattering parameter S-11 for the patch antenna has been calculated from the electrooptic measurement results of standing waves on the feeding line and compared with results from a conventional network analyzer.

Keywords

This publication has 12 references indexed in Scilit:

Electro-optic near-field mapping of planar resonators
IEEE Transactions on Antennas and Propagation, 1998
Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques
Optical and Quantum Electronics, 1996
A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits
IEEE Transactions on Microwave Theory and Techniques, 1996
A coaxial 0.5-18 GHz near electric field measurement system for planar microwave circuits using integrated probes
IEEE Transactions on Microwave Theory and Techniques, 1996
Characterization of a monolithic slot antenna using an electro-optic sampling technique
IEEE Microwave and Guided Wave Letters, 1994
Two-dimensional direct electra-optic field mapping in a monolithic integrated GaAs amplifier
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1993
External electro-optic integrated circuit probing
Microelectronic Engineering, 1990
Chapter 4 Electro-Optic Measurement Techniques for Picosecond Materials, Devices, and Integrated Circuits
Published by Elsevier ,1990
Electrooptic sampling in GaAs integrated circuits
IEEE Journal of Quantum Electronics, 1986
Subpicosecond electrooptic sampling: Principles and applications
IEEE Journal of Quantum Electronics, 1986