Scanning-force microscope based on an optical trap
- 1 October 1993
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 18 (19) , 1678-1680
- https://doi.org/10.1364/ol.18.001678
Abstract
An optically trapped prolate glass stylus is the force-sensing element of a novel scanning-force microscope. Stylus displacement is detected with the use of the forward scatter of the trapping laser beam. Radiation forces owing to the three-dimensional intensity distribution near the focus permit the stylus to be both positioned with fine control and oriented along the z (optic) axis. Details of 20-nm size appear in traces recorded with a crude stylus in a trap formed with 1064-nm radiation. The spring constant of the optical-force transducer is below 10−4 N/m, which is to be compared with ∼0.1 N/m for typical mechanical cantilevers used in atomic-force microscopy. This gentler technique should improve the sensitivity of scanning-force microscopy for the imaging of soft samples in aqueous media.Keywords
This publication has 6 references indexed in Scilit:
- Three-dimensional optical trapping and laser ablation of a single polymer latex particle in waterJournal of Applied Physics, 1991
- Optical measurement of picometer displacements of transparent microscopic objectsApplied Optics, 1990
- Determination of three-dimensional imaging properties of a light microscope system. Partial confocal behavior in epifluorescence microscopyBiophysical Journal, 1990
- Formation of submicron silicon-on-insulator structures by lateral oxidation of substrate-silicon islandsJournal of Vacuum Science & Technology B, 1988
- Observation of a single-beam gradient force optical trap for dielectric particlesOptics Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986