IIB-1 noise measurements on buried-channel charge-coupled devices

1 November 1975

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 22 (11) , 1057-1058
https://doi.org/10.1109/t-ed.1975.18283

Abstract

Summary form only. An abstract of the above-titled article taken from the Device Research Conference (24-26 June 1975, Carleton University, Ottawa, Ont., Canada) is presented.

Keywords

CHARGE
SUMMARY
NOISE MEASUREMENTS
IIB
BURIED
TITLED
OTTAWA
CARLETON
TAKEN

This publication has 3 references indexed in Scilit:

The effects of bulk traps on the performance of bulk channel charge-coupled devices
IEEE Transactions on Electron Devices, 1974
Characterization of surface channel CCD image arrays at low light levels
IEEE Journal of Solid-State Circuits, 1974
Experimental measurement of noise in charge-coupled devices
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1972