A method of determining the ratio of migration energy of lattice defects to order of annealing kinetics

Publisher Website

1 July 1965

journal article
Published by Elsevier in Physics Letters

Vol. 17 (2) , 105-106
https://doi.org/10.1016/0031-9163(65)90257-x

Abstract

No abstract available

Keywords

KINETICS

This publication has 1 reference indexed in Scilit:

Electrical Resistivity Study of Lattice Defects Introduced in Copper by 1.25-Mev Electron Irradiation at 80°K
Physical Review B, 1956