A glancing-incidence surface EXAFS study on epitaxially grown Al/Ni/Fe(001) thin films
- 1 June 1989
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 158 (1-3) , 662-663
- https://doi.org/10.1016/0921-4526(89)90429-8
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regionsPhysical Review B, 1988
- Improved ab initio calculations of amplitude and phase functions for extended x-ray absorption fine structure spectroscopyJournal of the American Chemical Society, 1988
- Epitaxial growth of body-centered-cubic nickel on ironSolid State Communications, 1987