A new method for matrix corrections by radioisotope excited x‐ray fluorescence
- 1 October 1983
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 12 (4) , 148-149
- https://doi.org/10.1002/xrs.1300120405
Abstract
A method has been investigated which allows calculations of the absorption correction factors in the energy range 1.0–5.0 keV using 55Fe excitation source. From the experimentally‐measured absorption factors between 6.0 and 20.0 keV using 109Cd excitation source, the coefficients at lower energies with the associated absorption jumps are generated through an iterative procedure.Keywords
This publication has 2 references indexed in Scilit:
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970