Wide dynamic range CMOS image sensor with pixel level ADC

20 February 2003

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 39 (4) , 360-361
https://doi.org/10.1049/el:20030246

Abstract

A new enhanced dynamic range (DR) and signal-to-noise ratio (SNR) CMOS imaging system with a pixel level analogue-to-digital converter (ADC) is presented. The proposed reset technique and time-to-digital converter increases DR and peak SNR simultaneously. The circuit reuse concept is also proposed to increase the fill factor.

Keywords

RESET TECHNIQUE
ENHANCED SNR IMAGING SYSTEM
ENHANCED DYNAMIC RANGE IMAGING SYSTEM
SIGNAL-TO-NOISE RATIO
TIME-TO-DIGITAL CONVERTER
CIRCUIT REUSE CONCEPT
WIDE DYNAMIC RANGE IMAGER
CMOS IMAGE SENSOR
FILL FACTOR IMPROVEMENT
PIXEL LEVEL ADC
PEAK SNR
ANALOGUE-TO-DIGITAL CONVERTER

This publication has 1 reference indexed in Scilit:

A 640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC
IEEE Journal of Solid-State Circuits, 1999