AFM investigations of the initial stages of prepolymer film growth on aluminium
- 1 March 1995
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 84 (3) , 273-283
- https://doi.org/10.1016/0169-4332(94)00546-x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Determination of the optical constants of metals and semiconductors by combining ellipsometry with electron spectroscopy microscopy and X-ray specular reflection analysisSurface Science, 1988
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- Ellipsometric and X-ray specular reflection studies on naturally grown overlayers on aluminium thin filmsThin Solid Films, 1984