Examination of the Reaction Kinetics at Solder/Metal Interfaces via High Temperature X-Ray Diffraction
- 1 January 1984
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Growth kinetics of intermetallic phases at the liquid Sn and solid Ni interfaceScripta Metallurgica, 1980
- Kinetics of WSi2 formation in the thin-film system W/PtSi/SiJournal of Applied Physics, 1973