Loss distribution measurement of silica-based waveguidesby using a jaggedness-free optical low coherence reflectometer
- 18 August 1994
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 30 (17) , 1441-1443
- https://doi.org/10.1049/el:19940986
Abstract
The loss distributions in silica-based waveguides are successfully measured using a jaggedness-free optical low coherence reflectometer (OLCR). The OLCR reduces the unavoidable jagged fluctuations which appear in Rayleigh backscattering measurements undertaken with conventional OLCRs to within ± 1 dB by averaging the wavelength-dependent Rayleigh backscatter signals. Constant loss distributions and a step-like loss increase in the waveguides were clearly observed.Keywords
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