Computer analysis of multi-channel SEM and X-ray images from fine particles
- 1 May 1972
- journal article
- Published by Elsevier in Pattern Recognition
- Vol. 4 (2) , 173-193
- https://doi.org/10.1016/0031-3203(72)90027-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Computerized method for size characterization of atmospheric aerosols by the scanning electron microscopeEnvironmental Science & Technology, 1971
- Computer processing of SEM images by contour analysesPattern Recognition, 1970
- Scanning Electron MicroscopyPublished by Elsevier ,1966