Structural and electrical investigations of silicon wafer bonding interfaces
- 15 December 1996
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 42 (1-3) , 164-167
- https://doi.org/10.1016/s0921-5107(96)01699-6
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Quantitative SEM/BIC studies of carrier recombination in silicon bicrystalsSemiconductor Science and Technology, 1987