An on-chip coupling capacitance measurement technique

Publisher Website

13 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/icvd.2001.902707

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Modeling and extraction of interconnect capacitances for multilayer VLSI circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1996
Measurements and interpretation of low-frequency noise in FET's
IEEE Transactions on Electron Devices, 1974