Measurement of thermal diffusivity of semiconductors by ngstr m's method
- 1 September 1960
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 37 (9) , 349-351
- https://doi.org/10.1088/0950-7671/37/9/310
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Experimental studies on the thermal conductivity in semiconductorsJournal of Physics and Chemistry of Solids, 1959
- Measurement of the Thermal Conductivity in SemiconductorsJournal of the Physics Society Japan, 1958
- Thermal Diffusivity of Metals at High TemperaturesJournal of Applied Physics, 1954
- The Thermal Diffusivity of some Poor ConductorsJournal of Scientific Instruments, 1949