A comparison of domain images obtained for nanophase alloys by magnetic force microscopy and high resolution Lorentz electron microscopy
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 31 (6) , 3349-3351
- https://doi.org/10.1109/20.490378
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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